eprintid: 19153
rev_number: 24
eprint_status: archive
userid: 602
dir: disk0/00/01/91/53
datestamp: 2010-03-31 12:30:23
lastmod: 2015-07-24 14:57:25
status_changed: 2010-03-31 12:30:23
type: article
metadata_visibility: show
item_issues_count: 0
creators_name: Mitrofanov, O.
creators_name: Tan, T.
creators_name: Mark, P.R.
creators_name: Bowden, B.
creators_name: Harrington, J.A.
creators_id: OMITR95
creators_id: TMTTA03
title: Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy
ispublished: pub
subjects: 8100
divisions: F46
note: Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 94 (17). 171104-1-171104-3 and may be found at http://dx.doi.org/10.1063/1.3126053
abstract: Propagation of terahertz waves in hollow metallic waveguides depends on the waveguide mode. Near-field scanning probe terahertz microscopy is applied to identify the mode structure and composition in dielectric-lined hollow metallic waveguides. Spatial profiles, relative amplitudes, and group velocities of three main waveguide modes are experimentally measured and matched to the HE11, HE12, and TE11 modes. The combination of near-field microscopy with terahertz time-resolved spectroscopy opens the possibility of waveguide mode characterization in the terahertz band.
date: 2009-04-27
official_url: http://dx.doi.org/10.1063/1.3126053
vfaculties: VENG
oa_status: green
language: eng
primo: open
primo_central: open_green
doi: 10.1063/1.3126053
lyricists_name: Mitrofanov, O
lyricists_name: Tan, T
lyricists_id: OMITR95
lyricists_id: TMTTA03
full_text_status: public
publication: Applied Physics Letters
volume: 94
number: 17
pagerange: 171104-1
issn: 0003-6951
citation:        Mitrofanov, O.;    Tan, T.;    Mark, P.R.;    Bowden, B.;    Harrington, J.A.;      (2009)    Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy.                   Applied Physics Letters , 94  (17)   pp. 171104-1.    10.1063/1.3126053 <https://doi.org/10.1063/1.3126053>.       Green open access   
 
document_url: https://discovery.ucl.ac.uk/id/eprint/19153/1/19153.pdf