%I Elsevier BV %T Recent advances in edge illumination X-ray phase contrast tomography %O © The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI. [DOI: 10.1117/1.JMI.4.4.040901] %D 2017 %A A Zamir %A C Hagen %A P Diemoz %A M Endrizzi %A F Vittoria %A Y Chen %A M Anastasio %A A Olivo %X Edge illumination (EI) is an X-ray phase contrast imaging technique, exploiting sensitivity to X-ray refraction in order to visualize features which are often not detected by conventional, absorption-based radiography. The method does not require a high degree of spatial coherence and is achromatic, and can therefore be implemented with both synchrotron radiation and commercial X-ray tubes. Using different retrieval algorithms, information about an object’s attenuation, refraction and scattering properties can be obtained. In recent years, a theoretical framework has been developed that enables EI computed tomography (CT), and hence three dimensional imaging. This review provides a summary of these advances, covering the development of different image acquisition schemes, retrieval approaches and applications. These developments constitute an integral part in the transformation of EI CT into a widely spread imaging tool, for use in a range of fields. %J Journal of Medical Imaging %N 4 %K X-ray imaging, phase contrast, tomography, edge illumination %L discovery1574684 %V 4