%I Elsevier BV
%T Recent advances in edge illumination X-ray phase contrast tomography
%O © The Authors. Published by SPIE
under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the
original publication, including its DOI. [DOI: 10.1117/1.JMI.4.4.040901]
%D 2017
%A A Zamir
%A C Hagen
%A P Diemoz
%A M Endrizzi
%A F Vittoria
%A Y Chen
%A M Anastasio
%A A Olivo
%X Edge illumination (EI) is an X-ray phase contrast imaging technique, exploiting sensitivity to X-ray
refraction in order to visualize features which are often not detected by conventional, absorption-based radiography.
The method does not require a high degree of spatial coherence and is achromatic, and can therefore be implemented
with both synchrotron radiation and commercial X-ray tubes. Using different retrieval algorithms, information about
an object’s attenuation, refraction and scattering properties can be obtained. In recent years, a theoretical framework
has been developed that enables EI computed tomography (CT), and hence three dimensional imaging. This review
provides a summary of these advances, covering the development of different image acquisition schemes, retrieval
approaches and applications. These developments constitute an integral part in the transformation of EI CT into a
widely spread imaging tool, for use in a range of fields.
%J Journal of Medical Imaging
%N 4
%K X-ray imaging, phase contrast, tomography, edge illumination
%L discovery1574684
%V 4