TY  - JOUR
N2  - Edge illumination (EI) is an X-ray phase contrast imaging technique, exploiting sensitivity to X-ray
refraction in order to visualize features which are often not detected by conventional, absorption-based radiography.
The method does not require a high degree of spatial coherence and is achromatic, and can therefore be implemented
with both synchrotron radiation and commercial X-ray tubes. Using different retrieval algorithms, information about
an object?s attenuation, refraction and scattering properties can be obtained. In recent years, a theoretical framework
has been developed that enables EI computed tomography (CT), and hence three dimensional imaging. This review
provides a summary of these advances, covering the development of different image acquisition schemes, retrieval
approaches and applications. These developments constitute an integral part in the transformation of EI CT into a
widely spread imaging tool, for use in a range of fields.
ID  - discovery1574684
PB  - Elsevier BV
UR  - http://dx.doi.org/10.1117/1.JMI.4.4.040901
SN  - 0920-5497
JF  - Journal of Medical Imaging
A1  - Zamir, A
A1  - Hagen, C
A1  - Diemoz, P
A1  - Endrizzi, M
A1  - Vittoria, F
A1  - Chen, Y
A1  - Anastasio, M
A1  - Olivo, A
KW  - X-ray imaging
KW  -  phase contrast
KW  -  tomography
KW  -  edge illumination
TI  - Recent advances in edge illumination X-ray phase contrast tomography
VL  - 4
AV  - public
Y1  - 2017/10//
IS  - 4
N1  - © The Authors. Published by SPIE
under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the
original publication, including its DOI. [DOI: 10.1117/1.JMI.4.4.040901]
ER  -