Agyeman, MO;
Tong, K-FK;
Mak, T;
(2015)
Towards Reliability and Performance-Aware Wireless Network-on-Chip Design.
In:
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS).
(pp. pp. 205-210).
IEEE: University of Massachusetts Amherst, USA.