?url_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.aufirst=G&rft.aulast=Xiong&rft.au=Xiong%2C+G&rft.pages=7747+-+7763&rft.volume=26&rft.atitle=Coherent+X-ray+diffraction+imaging+and+characterization+of+strain+in+silicon-on-insulator+nanostructures.&rft.title=Adv+Mater&rft.issue=46&rft.date=10+December+2014&rft.genre=article