eprintid: 1453997 rev_number: 26 eprint_status: archive userid: 608 dir: disk0/01/45/39/97 datestamp: 2014-11-03 22:58:24 lastmod: 2020-02-12 16:43:20 status_changed: 2015-05-06 10:56:21 type: article metadata_visibility: show item_issues_count: 0 creators_name: Oladipo, AO creators_name: Lavdas, S creators_name: Panoiu, NC creators_name: Lucibello, A creators_name: Sardi, GM creators_name: Proietti, E creators_name: Marcelli, R creators_name: Kasper, M creators_name: Kienberger, F title: Analysis of a transmission mode scanning microwave microscope for subsurface imaging at the nanoscale ispublished: pub divisions: UCL divisions: A01 divisions: B04 divisions: C05 divisions: F46 note: © 2014 AIP Publishing LLC abstract: We present a comprehensive analysis of the imaging characteristics of a scanning microwave microscopy (SMM) system operated in the transmission mode. In particular, we use rigorous three-dimensional finite-element simulations to investigate the effect of varying the permittivity and depth of sub-surface constituents of samples, on the scattering parameters of probes made of a metallic nano-tip attached to a cantilever. Our results prove that one can achieve enhanced imaging sensitivity in the transmission mode SMM (TM-SMM) configuration, from twofold to as much as 5× increase, as compared to that attainable in the widely used reflection mode SMM operation. In addition, we demonstrate that the phase of the S-parameter is much more sensitive to changes of the system parameters as compared to its magnitude, the scattering parameters being affected the most by variations in the conductivity of the substrate. Our analysis is validated by a good qualitative agreement between our modeling results and experimental data. These results suggest that TM-SMM systems can be used as highly efficient imaging tools with new functionalities, findings which could have important implications to the development of improved experimental imaging techniques. date: 2014-09-29 official_url: http://dx.doi.org/10.1063/1.4897278 vfaculties: VENG oa_status: green full_text_type: pub primo: open primo_central: open_green verified: verified_manual elements_source: Scopus elements_id: 989806 doi: 10.1063/1.4897278 lyricists_name: Panoiu, Nicolae-Coriolan lyricists_id: NPANO59 full_text_status: public publication: Applied Physics Letters volume: 105 number: 13 article_number: 133112 issn: 0003-6951 citation: Oladipo, AO; Lavdas, S; Panoiu, NC; Lucibello, A; Sardi, GM; Proietti, E; Marcelli, R; ... Kienberger, F; + view all <#> Oladipo, AO; Lavdas, S; Panoiu, NC; Lucibello, A; Sardi, GM; Proietti, E; Marcelli, R; Kasper, M; Kienberger, F; - view fewer <#> (2014) Analysis of a transmission mode scanning microwave microscope for subsurface imaging at the nanoscale. Applied Physics Letters , 105 (13) , Article 133112 . 10.1063/1.4897278 <https://doi.org/10.1063/1.4897278>. Green open access document_url: https://discovery.ucl.ac.uk/id/eprint/1453997/1/1.4897278.pdf