eprintid: 1453997
rev_number: 26
eprint_status: archive
userid: 608
dir: disk0/01/45/39/97
datestamp: 2014-11-03 22:58:24
lastmod: 2020-02-12 16:43:20
status_changed: 2015-05-06 10:56:21
type: article
metadata_visibility: show
item_issues_count: 0
creators_name: Oladipo, AO
creators_name: Lavdas, S
creators_name: Panoiu, NC
creators_name: Lucibello, A
creators_name: Sardi, GM
creators_name: Proietti, E
creators_name: Marcelli, R
creators_name: Kasper, M
creators_name: Kienberger, F
title: Analysis of a transmission mode scanning microwave microscope for subsurface imaging at the nanoscale
ispublished: pub
divisions: UCL
divisions: A01
divisions: B04
divisions: C05
divisions: F46
note: © 2014 AIP Publishing LLC 
abstract: We present a comprehensive analysis of the imaging characteristics of a scanning microwave microscopy (SMM) system operated in the transmission mode. In particular, we use rigorous three-dimensional finite-element simulations to investigate the effect of varying the permittivity and depth of sub-surface constituents of samples, on the scattering parameters of probes made of a metallic nano-tip attached to a cantilever. Our results prove that one can achieve enhanced imaging sensitivity in the transmission mode SMM (TM-SMM) configuration, from twofold to as much as 5× increase, as compared to that attainable in the widely used reflection mode SMM operation. In addition, we demonstrate that the phase of the S-parameter is much more sensitive to changes of the system parameters as compared to its magnitude, the scattering parameters being affected the most by variations in the conductivity of the substrate. Our analysis is validated by a good qualitative agreement between our modeling results and experimental data. These results suggest that TM-SMM systems can be used as highly efficient imaging tools with new functionalities, findings which could have important implications to the development of improved experimental imaging techniques.
date: 2014-09-29
official_url: http://dx.doi.org/10.1063/1.4897278
vfaculties: VENG
oa_status: green
full_text_type: pub
primo: open
primo_central: open_green
verified: verified_manual
elements_source: Scopus
elements_id: 989806
doi: 10.1063/1.4897278
lyricists_name: Panoiu, Nicolae-Coriolan
lyricists_id: NPANO59
full_text_status: public
publication: Applied Physics Letters
volume: 105
number: 13
article_number: 133112 
issn: 0003-6951
citation:        Oladipo, AO;    Lavdas, S;    Panoiu, NC;    Lucibello, A;    Sardi, GM;    Proietti, E;    Marcelli, R;         ... Kienberger, F; + view all <#>        Oladipo, AO;  Lavdas, S;  Panoiu, NC;  Lucibello, A;  Sardi, GM;  Proietti, E;  Marcelli, R;  Kasper, M;  Kienberger, F;   - view fewer <#>    (2014)    Analysis of a transmission mode scanning microwave microscope for subsurface imaging at the nanoscale.                   Applied Physics Letters , 105  (13)    , Article 133112 .  10.1063/1.4897278 <https://doi.org/10.1063/1.4897278>.       Green open access   
 
document_url: https://discovery.ucl.ac.uk/id/eprint/1453997/1/1.4897278.pdf