TY  - GEN
N1  - © (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only. This version is the version of record. For information on re-use, please refer to the publisher?s terms and conditions.
KW  - Science & Technology
KW  -  Technology
KW  -  Physical Sciences
KW  -  Engineering
KW  -  Electrical & Electronic
KW  -  Optics
KW  -  Imaging Science & Photographic Technology
KW  -  Engineering
KW  -  Face recognition
KW  -  pattern recognition
KW  -  similarity
KW  -  human vision
KW  -  graph matching
KW  -  Active Appearance Models
A1  - Stentiford, F
PB  - SPIE
AV  - public
CY  - San Francisco, California, U.S.
TI  - Face Recognition by Detection of Matching Cliques of Points
Y1  - 2014/03/07/
SN  - 0277-786X
T3  - Proc. SPIE
ID  - discovery1427719
UR  - http://dx.doi.org/10.1117/12.2036422
N2  - This paper addresses the problem of face recognition using a graphical representation to identify structure that is common to pairs of images. Matching graphs are constructed where nodes correspond to image locations and edges are dependent on the relative orientation of the nodes. Similarity is determined from the size of maximal matching cliques in pattern pairs. The method uses a single reference face image to obtain recognition without a training stage. The Yale Face Database A is used to compare performance with earlier work on faces containing variations in expression, illumination, occlusion and pose and for the first time obtains a 100% correct recognition result.
ER  -