Sinthiptharakoon, K;
Schofield, SR;
Studer, P;
Brazdova, V;
Hirjibehedin, CF;
Bowler, DR;
Curson, NJ;
(2014)
Investigating individual arsenic dopant atoms in silicon using low-temperature scanning tunnelling microscopy.
JOURNAL OF PHYSICS-CONDENSED MATTER
, 26
(1)
, Article ARTN 012001. 10.1088/0953-8984/26/1/012001.