Vanhoestenberghe, A;    Donaldson, N;      (2013)    Corrosion of silicon integrated circuits and lifetime predictions in implantable electronic devices.                   Journal of Neural Engineering , 10  (3)    , Article 031002.  10.1088/1741-2560/10/3/031002 <https://doi.org/10.1088/1741-2560%2F10%2F3%2F031002>.       Green open access