@article{discovery112717,
         journal = {PHYS REV LETT},
       publisher = {AMERICAN PHYSICAL SOC},
           title = {Microscopic and macroscopic signatures of antiferromagnetic domain walls},
            note = {{\copyright} 2007 The American Physical Society},
          volume = {98},
            year = {2007},
          number = {11},
           month = {March},
          author = {Jaramillo, R and Rosenbaum, TF and Isaacs, ED and Shpyrko, OG and Evans, PG and Aeppli, G and Cai, Z},
             url = {http://dx.doi.org/10.1103/PhysRevLett.98.117206},
            issn = {0031-9007},
        keywords = {MAGNETIC-FIELD DEPENDENCE, X-RAY MICRODIFFRACTION, CHROMIUM, TEMPERATURE, RESISTIVITY, RESISTANCE, FILMS},
        abstract = {Magnetotransport measurements on small single crystals of Cr, the elemental antiferromagnet, reveal the hysteretic thermodynamics of the domain structure. The temperature dependence of the transport coefficients is directly correlated with the real-space evolution of the domain configuration as recorded by x-ray microprobe imaging, revealing the effect of antiferromagnetic domain walls on electron transport. A single antiferromagnetic domain wall interface resistance is deduced to be of order 5x10(-5) mu Omega cm(2) at a temperature of 100 K.}
}