@article{discovery10204663,
       publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
            year = {2025},
         journal = {IEEE Transactions on Applied Superconductivity},
           month = {January},
           pages = {1--5},
           title = {An Integrated Deep-Cryogenic Temperature Sensor in CMOS Technology for Quantum Computing Applications},
            note = {This version is the author accepted manuscript. For information on re-use, please refer to the publisher's terms and conditions.},
          author = {Olivieri, F and Noah, GM and Swift, T and Fernando Gonzalez-Zalba, M and Morton, JJL and Gomez-Saiz, A},
        abstract = {On-chip thermometry at deep-cryogenic temperatures is vital in quantum computing applications to accurately quantify the effect of increased temperature on qubit performance. In this work, we present a sub-1 K temperature sensor in CMOS technology based on the temperature dependence of the critical current of a superconducting (SC) thin-film. The sensor is implemented in 22-nm fully depleted silicon on insulator (FDSOI) technology and comprises a 6-nA-resolution current-output digital-to-analog converter (DAC), a transimpedance amplifier (TIA) with a SC thin-film as a gain element, and a voltage comparator. The circuit dissipates 1.5 {\ensuremath{>}}{\ensuremath{\mu}} W and is demonstrated operating at ambient temperatures as low as 15 mK, providing a variable temperature resolution reaching sub-10 mK.},
        keywords = {Cryo-CMOS, cryogenic electronics, digital-toanalog converter (DAC), fully-depleted silicon-on-insulator (FDSOI), superconducting devices, temperature sensor},
             url = {https://doi.org/10.1109/tasc.2025.3536636}
}