eprintid: 10196250
rev_number: 9
eprint_status: archive
userid: 699
dir: disk0/10/19/62/50
datestamp: 2024-08-29 07:16:35
lastmod: 2024-08-29 07:16:35
status_changed: 2024-08-29 07:16:35
type: article
metadata_visibility: show
sword_depositor: 699
creators_name: Bhatt, Prajna
creators_name: Isaacs, Mark
creators_name: Liu, Yuhan
creators_name: Palgrave, Robert G
title: Correlation analysis in X-ray photoemission spectroscopy
ispublished: pub
divisions: UCL
divisions: B04
divisions: C06
divisions: F56
keywords: XPS, Polymers, Correlation
note: © 2024 The Author(s). Published by Elsevier B.V. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
abstract: X-ray photoelectron spectroscopy (XPS) is a powerful technique for surface analysis, but its application can be hindered by uncertainty in modelling spectra. Often, many spectral models have a similar goodness of fit, and distinguishing between them can be impossible without additional information. A further challenge is found in interpreting spectra from samples consisting of multiple chemical compounds. We show here how correlation analysis can be used to interpret large XPS datasets. Correlations in atomic concentrations and binding energies of core lines can be interpreted within a framework of an underlying chemical model and this can yield additional information compared with analysis of each spectrum individually. We give examples of the usage of this analysis on some simple systems, and discuss the potential and limitations of the technique.
date: 2024-11-01
date_type: published
publisher: ELSEVIER
official_url: http://dx.doi.org/10.1016/j.apsusc.2024.160808
oa_status: green
full_text_type: pub
language: eng
primo: open
primo_central: open_green
verified: verified_manual
elements_id: 2305024
doi: 10.1016/j.apsusc.2024.160808
lyricists_name: Palgrave, Robert
lyricists_name: Isaacs, Mark
lyricists_id: RPALG32
lyricists_id: MISAA73
actors_name: Palgrave, Robert
actors_id: RPALG32
actors_role: owner
funding_acknowledgements: [China Scholarship Council]; EP/Y023587/1
full_text_status: public
publication: Applied Surface Science
volume: 672
article_number: 160808
pages: 11
issn: 0169-4332
citation:        Bhatt, Prajna;    Isaacs, Mark;    Liu, Yuhan;    Palgrave, Robert G;      (2024)    Correlation analysis in X-ray photoemission spectroscopy.                   Applied Surface Science , 672     , Article 160808.  10.1016/j.apsusc.2024.160808 <https://doi.org/10.1016/j.apsusc.2024.160808>.       Green open access   
 
document_url: https://discovery.ucl.ac.uk/id/eprint/10196250/1/Palgrave_1-s2.0-S0169433224015216-main.pdf