eprintid: 10196250 rev_number: 9 eprint_status: archive userid: 699 dir: disk0/10/19/62/50 datestamp: 2024-08-29 07:16:35 lastmod: 2024-08-29 07:16:35 status_changed: 2024-08-29 07:16:35 type: article metadata_visibility: show sword_depositor: 699 creators_name: Bhatt, Prajna creators_name: Isaacs, Mark creators_name: Liu, Yuhan creators_name: Palgrave, Robert G title: Correlation analysis in X-ray photoemission spectroscopy ispublished: pub divisions: UCL divisions: B04 divisions: C06 divisions: F56 keywords: XPS, Polymers, Correlation note: © 2024 The Author(s). Published by Elsevier B.V. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/). abstract: X-ray photoelectron spectroscopy (XPS) is a powerful technique for surface analysis, but its application can be hindered by uncertainty in modelling spectra. Often, many spectral models have a similar goodness of fit, and distinguishing between them can be impossible without additional information. A further challenge is found in interpreting spectra from samples consisting of multiple chemical compounds. We show here how correlation analysis can be used to interpret large XPS datasets. Correlations in atomic concentrations and binding energies of core lines can be interpreted within a framework of an underlying chemical model and this can yield additional information compared with analysis of each spectrum individually. We give examples of the usage of this analysis on some simple systems, and discuss the potential and limitations of the technique. date: 2024-11-01 date_type: published publisher: ELSEVIER official_url: http://dx.doi.org/10.1016/j.apsusc.2024.160808 oa_status: green full_text_type: pub language: eng primo: open primo_central: open_green verified: verified_manual elements_id: 2305024 doi: 10.1016/j.apsusc.2024.160808 lyricists_name: Palgrave, Robert lyricists_name: Isaacs, Mark lyricists_id: RPALG32 lyricists_id: MISAA73 actors_name: Palgrave, Robert actors_id: RPALG32 actors_role: owner funding_acknowledgements: [China Scholarship Council]; EP/Y023587/1 full_text_status: public publication: Applied Surface Science volume: 672 article_number: 160808 pages: 11 issn: 0169-4332 citation: Bhatt, Prajna; Isaacs, Mark; Liu, Yuhan; Palgrave, Robert G; (2024) Correlation analysis in X-ray photoemission spectroscopy. Applied Surface Science , 672 , Article 160808. 10.1016/j.apsusc.2024.160808 <https://doi.org/10.1016/j.apsusc.2024.160808>. Green open access document_url: https://discovery.ucl.ac.uk/id/eprint/10196250/1/Palgrave_1-s2.0-S0169433224015216-main.pdf