TY - JOUR Y1 - 2024/11/01/ N1 - © 2024 The Author(s). Published by Elsevier B.V. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/). ID - discovery10196250 PB - ELSEVIER TI - Correlation analysis in X-ray photoemission spectroscopy JF - Applied Surface Science N2 - X-ray photoelectron spectroscopy (XPS) is a powerful technique for surface analysis, but its application can be hindered by uncertainty in modelling spectra. Often, many spectral models have a similar goodness of fit, and distinguishing between them can be impossible without additional information. A further challenge is found in interpreting spectra from samples consisting of multiple chemical compounds. We show here how correlation analysis can be used to interpret large XPS datasets. Correlations in atomic concentrations and binding energies of core lines can be interpreted within a framework of an underlying chemical model and this can yield additional information compared with analysis of each spectrum individually. We give examples of the usage of this analysis on some simple systems, and discuss the potential and limitations of the technique. KW - XPS KW - Polymers KW - Correlation VL - 672 UR - http://dx.doi.org/10.1016/j.apsusc.2024.160808 SN - 0169-4332 A1 - Bhatt, Prajna A1 - Isaacs, Mark A1 - Liu, Yuhan A1 - Palgrave, Robert G AV - public EP - 11 ER -