Nakazawa, R;
Matsuzaki, A;
Shimizu, K;
Nakamura, I;
Kawashima, E;
Makita, S;
Tanaka, K;
... Ishii, H; + view all
(2024)
Reliable measurement of the density of states including occupied in-gap states of an amorphous In-Ga-Zn-O thin film via photoemission spectroscopies: Direct observation of light-induced in-gap states.
Journal of Applied Physics
, 135
(8)
, Article 085301. 10.1063/5.0185405.