Heenan, TMM; Mombrini, I; Llewellyn, A; Checchia, S; Tan, C; Johnson, MJ; Jnawali, A; ... Shearing, PR; + view all Heenan, TMM; Mombrini, I; Llewellyn, A; Checchia, S; Tan, C; Johnson, MJ; Jnawali, A; Garbarino, G; Jervis, R; Brett, DJL; Di Michiel, M; Shearing, PR; - view fewer (2023) Mapping internal temperatures during high-rate battery applications. Nature , 617 (7961) pp. 507-512. 10.1038/s41586-023-05913-z.