Lanza, M; Waser, R; Ielmini, D; Yang, JJ; Goux, L; Suñe, J; Kenyon, AJ; ... Pazos, S; + view all Lanza, M; Waser, R; Ielmini, D; Yang, JJ; Goux, L; Suñe, J; Kenyon, AJ; Mehonic, A; Spiga, S; Rana, V; Wiefels, S; Menzel, S; Valov, I; Villena, MA; Miranda, E; Jing, X; Campabadal, F; Gonzalez, MB; Aguirre, F; Palumbo, F; Zhu, K; Roldan, JB; Puglisi, FM; Larcher, L; Hou, T-H; Prodromakis, T; Yang, Y; Huang, P; Wan, T; Chai, Y; Pey, KL; Raghavan, N; Dueñas, S; Wang, T; Xia, Q; Pazos, S; - view fewer (2021) Standards for the Characterization of Endurance in Resistive Switching Devices. ACS Nano 10.1021/acsnano.1c06980. (In press).