Sensoy, M;    Saleki, M;    Julier, S;    Aydogan, R;    Reid, J;      (2021)    Misclassification Risk and Uncertainty Quantification in Deep Classifiers.                     In:  Proceedings of the IEEE Winter Conference on Applications of Computer Vision (WACV) 2021.  (pp. pp. 2483-2491).  Institute of Electrical and Electronics Engineers (IEEE)       Green open access