White, R;
Krinke, J;
Barr, ET;
Sarro, F;
Ragkhitwetsagul, C;
(2021)
Artefact Relation Graphs for Unit Test Reuse Recommendation.
In:
2021 14th IEEE Conference on Software Testing, Verification and Validation (ICST).
(pp. pp. 137-147).
IEEE: Porto de Galinhas, Brazil.