?url_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Adissertation&rft.aulast=Patel&rft.aufirst=Kamal&rft.au=Patel%2C+Kamal&rft.inst=UCL+(University+College+London)&rft.title=Electrical+Stress+Induced+Structural+Dynamics+in+Silicon+Oxide+Resistive+Memories&rft.degree=Doctoral&rft.date=28+March+2021&rft.tpages=306