eprintid: 10057544 rev_number: 19 eprint_status: archive userid: 608 dir: disk0/10/05/75/44 datestamp: 2018-10-04 15:45:40 lastmod: 2021-12-13 03:09:15 status_changed: 2018-10-04 15:45:40 type: article metadata_visibility: show creators_name: Godfrey, T creators_name: Gallop, JC creators_name: Cox, DC creators_name: Romans, EJ creators_name: Chen, J creators_name: Hao, L title: Investigation of Dayem Bridge NanoSQUIDs Made by Xe Focused Ion Beam ispublished: pub divisions: UCL divisions: B04 divisions: C05 divisions: F46 keywords: Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Physics, Applied, Engineering, Physics, Focused ion beam (FIB), microwave, nanoscale, nanoSQUID, superconducting QUantum Interference Device (SQUIDs), Xe FIB, QUANTUM INTERFERENCE DEVICE note: This work is licensed under a Creative Commons Attribution 3.0 License. For more information, see http://creativecommons.org/licenses/by/3.0/ abstract: Superconducting QUantum Interference Devices (SQUIDs) based on nanobridge junctions have shown increasing promise for single particle detection. This paper describes the development of the fabrication of improved and reproducible nanobridge junctions fabricated by focused ion beam (FIB) milling from niobium thin films. Although the very low noise properties of nanobridge SQUIDs are well known, the nature of the milling process is little understood at the level of local superconducting properties. In this paper, we report the results for nanobridge Josephson devices and SQUIDs, which we believe are the first to be made by Xenon (Xe) FIB milling. Temperature-dependent current-voltage behavior, microwave-induced Shapiro steps, and SQUID response to magnetic fields have been measured. We make preliminary comparisons with nominally identical devices milled from Nb thin films using either Xe or Ga ions. date: 2018-07-19 date_type: published publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC official_url: https://doi.org/10.1109/TASC.2018.2854624 oa_status: green full_text_type: pub language: eng primo: open primo_central: open_green article_type_text: Article verified: verified_manual elements_id: 1577952 doi: 10.1109/TASC.2018.2854624 lyricists_name: Romans, Edward lyricists_id: EROMA03 actors_name: Cuccu, Clara actors_id: CCCUC40 actors_role: owner full_text_status: public publication: IEEE Transactions on Applied Superconductivity volume: 28 number: 7 pages: 5 issn: 1558-2515 citation: Godfrey, T; Gallop, JC; Cox, DC; Romans, EJ; Chen, J; Hao, L; (2018) Investigation of Dayem Bridge NanoSQUIDs Made by Xe Focused Ion Beam. IEEE Transactions on Applied Superconductivity , 28 (7) 10.1109/TASC.2018.2854624 <https://doi.org/10.1109/TASC.2018.2854624>. Green open access document_url: https://discovery.ucl.ac.uk/id/eprint/10057544/1/Godfrey_Investigation.pdf