TY  - JOUR
SN  - 1558-2515
UR  - https://doi.org/10.1109/TASC.2018.2854624
A1  - Godfrey, T
A1  - Gallop, JC
A1  - Cox, DC
A1  - Romans, EJ
A1  - Chen, J
A1  - Hao, L
JF  - IEEE Transactions on Applied Superconductivity
VL  - 28
N1  - This work is licensed under a Creative Commons Attribution 3.0 License. For more information, see http://creativecommons.org/licenses/by/3.0/
IS  - 7
PB  - IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
ID  - discovery10057544
N2  - Superconducting QUantum Interference Devices (SQUIDs) based on nanobridge junctions have shown increasing promise for single particle detection. This paper describes the development of the fabrication of improved and reproducible nanobridge junctions fabricated by focused ion beam (FIB) milling from niobium thin films. Although the very low noise properties of nanobridge SQUIDs are well known, the nature of the milling process is little understood at the level of local superconducting properties. In this paper, we report the results for nanobridge Josephson devices and SQUIDs, which we believe are the first to be made by Xenon (Xe) FIB milling. Temperature-dependent current-voltage behavior, microwave-induced Shapiro steps, and SQUID response to magnetic fields have been measured. We make preliminary comparisons with nominally identical devices milled from Nb thin films using either Xe or Ga ions.
KW  - Science & Technology
KW  -  Technology
KW  -  Physical Sciences
KW  -  Engineering
KW  -  Electrical & Electronic
KW  -  Physics
KW  -  Applied
KW  -  Engineering
KW  -  Physics
KW  -  Focused ion beam (FIB)
KW  -  microwave
KW  -  nanoscale
KW  -  nanoSQUID
KW  -  superconducting QUantum Interference Device (SQUIDs)
KW  -  Xe FIB
KW  -  QUANTUM INTERFERENCE DEVICE
EP  - 5
AV  - public
Y1  - 2018/07/19/
TI  - Investigation of Dayem Bridge NanoSQUIDs Made by Xe Focused Ion Beam
ER  -