Heenan, TMM;
Lu, X;
Iacoviello, F;
Robinson, JB;
Brett, DJL;
Shearing, PR;
(2018)
Thermally Driven SOFC Degradation in 4D: Part I. Microscale.
Journal of The Electrochemical Society
, 165
(11)
F921-F931.
10.1149/2.0151811jes.