?url_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.au=Loto%2C+O&rft.aufirst=O&rft.aulast=Loto&rft.atitle=Gate+Oxide+Electrical+Stability+of+p-type+Diamond+MOS+Capacitors&rft.volume=65&rft.date=28+June+2018&rft.title=IEEE+Transactions+on+Electron+Devices&rft.pages=3361-3364&rft.issn=0018-9383&rft.issue=8&rft.genre=article