TY  - INPR
N1  - This article is licensed under a Creative Commons Attribution 3.0 Unported Licence. (https://creativecommons.org/licenses/by/3.0/)
Y1  - 2018/07/24/
AV  - public
TI  - The interplay between structure and function in redox-based resistance switching
A1  - Kenyon, AJ
A1  - Munde, M
A1  - Ng, W
A1  - Buckwell, M
A1  - Joksas, D
A1  - Mehonic, A
JF  - Faraday Discussions
UR  - http://dx.doi.org/10.1039/C8FD00118A
PB  - Royal Society of Chemistry
SN  - 1359-6640
N2  - We report a study of the relationship between oxide microstructure at the scale of tens of nanometres and resistance switching behaviour in silicon oxide. In the case of sputtered amorphous oxides, the presence of columnar structure enables efficient resistance switching by providing an intial structured distribution of defects that can act as precursors for the formation of chains of conductive oxygen vacancies under the application of appropriate electrical bias. Increasing electrode interface roughness decreases electroforming voltages and reduces the distribution of switching voltages. Any contribution to these effects from field enhancement at rough interfaces is secondary to changes in oxide microstructure templated by interface structure.
ID  - discovery10051529
ER  -