Huang, X;
Yan, H;
Ge, M;
Ozturk, H;
Nazaretski, E;
Robinson, IK;
Chu, YS;
(2017)
Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy.
Applied Physics Letters
, 111
(2)
, Article 023103. 10.1063/1.4993744.
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Abstract
We report our experiences with conducting ptychography simultaneously with the X-ray fluorescence measurement using the on-the-fly mode for efficient multi-modality imaging. We demonstrate that the periodic artifact inherent to the raster scan pattern can be mitigated using a sufficiently fine scan step size to provide an overlap ratio of >70%. This allows us to obtain transmitted phase contrast images with enhanced spatial resolution from ptychography while maintaining the fluorescence imaging with continuous-motion scans on pixelated grids. This capability will greatly improve the competence and throughput of scanning probe X-ray microscopy.
| Type: | Article |
|---|---|
| Title: | Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1063/1.4993744 |
| Publisher version: | http://doi.org/10.1063/1.4993744 |
| Language: | English |
| Additional information: | This version is the Accepted Version of the Manuscript. For information on re-use, please refer to the publisher’s terms and conditions. |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology |
| URI: | https://discovery.ucl.ac.uk/id/eprint/1569777 |
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