Shi, X;
Clark, JN;
Xiong, G;
Huang, X;
Harder, R;
Robinson, IK;
(2013)
Mechanical breakdown of bent silicon nanowires imaged by coherent x-ray diffraction.
NEW JOURNAL OF PHYSICS
, 15
, Article ARTN 123007. 10.1088/1367-2630/15/12/123007.
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Abstract
We have developed a method of coherent x-ray diffractive imaging to surmount its inability to image the structure of strongly strained crystals. We used calculated models from finite–element analysis to guide an iterative algorithm to fit experimental data from a series of increasingly bent wires cut into silicon-on-insulator films. Just before mechanical fracture, the wires were found to contain new phase structures, which are identified as dislocations associated with crossing the elastic limit.
| Type: | Article |
|---|---|
| Title: | Mechanical breakdown of bent silicon nanowires imaged by coherent x-ray diffraction |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1088/1367-2630/15/12/123007 |
| Publisher version: | http://dx.doi.org/10.1088/1367-2630/15/12/123007 |
| Additional information: | © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology |
| URI: | https://discovery.ucl.ac.uk/id/eprint/1421782 |
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