UCL Discovery
UCL home » Library Services » Electronic resources » UCL Discovery

The use of the potential drop technique for creep damage monitoring and end of life warning for high temperature components

Wojcik, A; Waitt, M; Santos, A; (2018) The use of the potential drop technique for creep damage monitoring and end of life warning for high temperature components. Materials at High Temperatures , 34 (5-6) pp. 458-465. 10.1080/09603409.2017.1384611. Green open access

[thumbnail of Wojcik.pdf]
Preview
Text
Wojcik.pdf - Accepted Version

Download (3MB) | Preview

Abstract

Electrical potential drop (EPD) is a well-established technique for the measurement of crack initiation/growth in metals. Two variants exist, one using AC excitation, the other using DC. EPD provides crack dimensions (principally depth) in contexts such as fracture/fatigue testing, and in-field NDE. Whilst it has been employed for on and off-line assessment of creep damage, use within a non-lab (i.e. industrial) context is limited by connection issues and, significantly, data interpretation – especially with regard to detecting subtle changes in EPD over general background ‘noise’. We describe, here, a methodology where high sensitivity detection of creep damage can be achieved by looking for a characteristic ‘signature’ within data. This is based on the combination of AC-EPD with its DC equivalent so as to generate a synergistic approach to damage detection. The methodology has been successfully applied to a semi-industrial context to provide prior warning of failure in excess of several weeks.

Type: Article
Title: The use of the potential drop technique for creep damage monitoring and end of life warning for high temperature components
Open access status: An open access version is available from UCL Discovery
DOI: 10.1080/09603409.2017.1384611
Publisher version: http://doi.org/10.1080/09603409.2017.1384611
Language: English
Additional information: © 2017 Informa UK Limited, trading as Taylor & Francis Group. This version is the author accepted manuscript. For information on re-use, please refer to the publisher’s terms and conditions.
Keywords: Electrical potential drop, EPD, ACPD, DCPD, creep, on-line monitoring
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Mechanical Engineering
URI: https://discovery.ucl.ac.uk/id/eprint/10028876
Downloads since deposit
263Downloads
Download activity - last month
Download activity - last 12 months
Downloads by country - last 12 months

Archive Staff Only

View Item View Item