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Mode Imaging and Dispersion Analysis in Terahertz Waveguides using Terahertz Near-field Microscopy

Mitrofanov, O; Tan, T; Mark, PR; Bowden, B; Harrington, JA; (2009) Mode Imaging and Dispersion Analysis in Terahertz Waveguides using Terahertz Near-field Microscopy. In: 2009 CONFERENCE ON LASERS AND ELECTRO-OPTICS AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2009), VOLS 1-5. (pp. 1799 - 1800). IEEE

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Abstract

Mode structure, transmission loss and dispersion are characterized in low-loss (similar to 1dB/m) Terahertz (THz) dielectric-lined hollow metallic waveguides. THz near-field probe imaging and spectroscopy is applied for precise mode imaging and selective mode probing. (c) 2009 Optical Society of America

Type: Proceedings paper
Title: Mode Imaging and Dispersion Analysis in Terahertz Waveguides using Terahertz Near-field Microscopy
Event: Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference (CLEO/QELS 2009)
Location: Baltimore, MD
Dates: 2009-06-02 - 2009-06-04
ISBN-13: 978-1-4244-5184-5
UCL classification: UCL > School of BEAMS > Faculty of Engineering Science > Electronic and Electrical Engineering
URI: http://discovery.ucl.ac.uk/id/eprint/87144
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