ALMAHAMID, I; BRYAN, JC; BUCHER, JJ; BURRELL, AK; EDELSTEIN, NM; HUDSON, EA; ... REICH, T; + view all ALMAHAMID, I; BRYAN, JC; BUCHER, JJ; BURRELL, AK; EDELSTEIN, NM; HUDSON, EA; KALTSOYANNIS, N; LUKENS, WW; SHUH, DK; NITSCHE, H; REICH, T; - view fewer (1995) ELECTRONIC AND STRUCTURAL INVESTIGATIONS OF TECHNETIUM COMPOUNDS BY X-RAY-ABSORPTION SPECTROSCOPY. INORG CHEM , 34 (1) 193 - 198.
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X-ray absorption near edge structure spectroscopy has been used to establish the chemical shifts of the technetium K edge ina range of compounds containing Tc in a variety of formal oxidation states. The edge positions span 19.9 eV from Tc metal to NH4TcO4. Strong correlation between chemical shift and formal oxidation state is observed. Extended X-ray absorption fine structure (EXAFS) spectroscopy of Tc-2(CO)(10) indicates that multiple scattering along the Tc-C-vector is more important than direct Tc..O scattering. TcO2 is shown by EXAFS to possess a distorted rutile structure with a closest Tc-Tc distance of 2.61 Angstrom. This is rationalized in terms of the Goodenough model for bonding in transition metal dioxides.
|Title:||ELECTRONIC AND STRUCTURAL INVESTIGATIONS OF TECHNETIUM COMPOUNDS BY X-RAY-ABSORPTION SPECTROSCOPY|
|Keywords:||FINE-STRUCTURE, EXAFS, REACTIVITY, COMPLEXES, OXIDES|
|UCL classification:||UCL > School of BEAMS > Faculty of Maths and Physical Sciences > Chemistry|
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