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Improved Kelvin probe force microscopy for imaging individual DNA molecules on insulating surfaces

Leung, C; Maradan, D; Kramer, A; Howorka, S; Mesquida, P; Hoogenboom, BW; (2010) Improved Kelvin probe force microscopy for imaging individual DNA molecules on insulating surfaces. APPL PHYS LETT , 97 (20) , Article 203703. 10.1063/1.3512867.

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Abstract

Electrostatic forces and potentials are keys in determining the interactions between biomolecules. We have recently imaged the topography and electrostatic surface potential of nucleic acid molecules on silicon surfaces using Kelvin probe force microscopy (KPFM). Here, we demonstrate KPFM imaging on insulating surfaces like mica, which provides access to configurations of DNA that are projections of its structure in solution. In particular, we apply dual-frequency mode to minimize the tip-sample distance at which the Kelvin probe signal is acquired and use the fundamental resonance of the cantilever to determine surface potential and its first overtone to detect the topography. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3512867]

Type:Article
Title:Improved Kelvin probe force microscopy for imaging individual DNA molecules on insulating surfaces
DOI:10.1063/1.3512867
Keywords:LABEL-FREE, ELECTROSTATICS, BINDING, FILMS
UCL classification:UCL > School of BEAMS > Faculty of Maths and Physical Sciences > Chemistry
UCL > School of BEAMS > Faculty of Maths and Physical Sciences > Physics and Astronomy

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