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RHEED Studies and Interface Analysis of GaAs grown on Si(001)

Woodbridge, K; Gowers, JP; Fewster, PF; Neave, JH; (1987) RHEED Studies and Interface Analysis of GaAs grown on Si(001). Journal of Crystal growth , 81 pp. 224-225.

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Type: Article
Title: RHEED Studies and Interface Analysis of GaAs grown on Si(001)
UCL classification: UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
URI: http://discovery.ucl.ac.uk/id/eprint/64713
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