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BROADENING OF RESONANCE LINES BY CHARGED DISLOCATIONS

STONEHAM, AM; (1974) BROADENING OF RESONANCE LINES BY CHARGED DISLOCATIONS. J PHYS C SOLID STATE , 7 (5) 871 - 878. 10.1088/0022-3719/7/5/010. Green open access

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Abstract

It is shown that the random electric fields of charge dislocations in insulators should cause appreciable broadening of sharp resonance lines such as spin-resonance signals. The degree of broadening is very sensitive to the screening of the dislocations by charged point defects. Since the shape of the inhomogeneously broadened resonance line monitors the distribution of the internal fields, the lineshape can be used to deduce properties of the charged dislocations, like their charge per unit length and the degree of screening. Quantitative calculations are presented which suggest that spectroscopic methods, notably spin resonance, should provide a convenient method of investigating charged dislocations.

Type: Article
Title: BROADENING OF RESONANCE LINES BY CHARGED DISLOCATIONS
Open access status: An open access version is available from UCL Discovery
DOI: 10.1088/0022-3719/7/5/010
Publisher version: http://dx.doi.org/10.1088/0022-3719/7/5/010
Language: English
Additional information: Text made available to UCL Discovery by kind permission of IOP Publishing, 2012
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology
URI: http://discovery.ucl.ac.uk/id/eprint/59734
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