Nathan, A and Alexander, S and Sakariya, K and Servati, P and Tao, S and Striakhilev, D and Kumar, A and Sambandan, S and Jafarabadiashtiani, S and Vigranenko, Y and Church, C and Wzorek, J and Arsenault, P (2004) Extreme AMOLED backplanes in a-Si with proven stability. In: SID Symposium Digest of Technical Papers. (pp. 1508 - 1511). Society for Information Display: San Jose, US.
Full text not available from this repository.
Abstract
Instability has long been a barrier to the use of a-Si AMOLED backplanes. We present here the first demonstration of proven stability of a-Si AMOLED pixels. Over 7000h of stability data is shown for pixel circuits that compensate for threshold-voltage shift, temperature, and OLED degradation (extreme compensation). This demonstrates that stable AMOLED backplanes are achievable using well-established and proven a-Si TFT technology in mainstream use by the flat panel display industry.
| Type: | Proceedings paper |
|---|---|
| Title: | Extreme AMOLED backplanes in a-Si with proven stability |
| DOI: | 10.1889/1.1825780 |
| Publisher version: | http://dx.doi.org/10.1889/1.1825780 |
| UCL classification: | UCL > School of BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology |
Archive Staff Only: edit this record