Nathan, A; Alexander, S; Sakariya, K; Servati, P; Tao, S; Striakhilev, D; ... Arsenault, P; + view all Nathan, A; Alexander, S; Sakariya, K; Servati, P; Tao, S; Striakhilev, D; Kumar, A; Sambandan, S; Jafarabadiashtiani, S; Vigranenko, Y; Church, C; Wzorek, J; Arsenault, P; - view fewer (2004) Extreme AMOLED backplanes in a-Si with proven stability. In: SID Symposium Digest of Technical Papers. (pp. 1508 - 1511). Society for Information Display: San Jose, US.
Full text not available from this repository.
Instability has long been a barrier to the use of a-Si AMOLED backplanes. We present here the first demonstration of proven stability of a-Si AMOLED pixels. Over 7000h of stability data is shown for pixel circuits that compensate for threshold-voltage shift, temperature, and OLED degradation (extreme compensation). This demonstrates that stable AMOLED backplanes are achievable using well-established and proven a-Si TFT technology in mainstream use by the flat panel display industry.
|Title:||Extreme AMOLED backplanes in a-Si with proven stability|
|UCL classification:||UCL > School of BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology|
Archive Staff Only: edit this record