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Extreme AMOLED backplanes in a-Si with proven stability

Nathan, A; Alexander, S; Sakariya, K; Servati, P; Tao, S; Striakhilev, D; ... Arsenault, P; + view all (2004) Extreme AMOLED backplanes in a-Si with proven stability. In: SID Symposium Digest of Technical Papers. (pp. 1508 - 1511). Society for Information Display: San Jose, US.

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Abstract

Instability has long been a barrier to the use of a-Si AMOLED backplanes. We present here the first demonstration of proven stability of a-Si AMOLED pixels. Over 7000h of stability data is shown for pixel circuits that compensate for threshold-voltage shift, temperature, and OLED degradation (extreme compensation). This demonstrates that stable AMOLED backplanes are achievable using well-established and proven a-Si TFT technology in mainstream use by the flat panel display industry.

Type:Proceedings paper
Title:Extreme AMOLED backplanes in a-Si with proven stability
DOI:10.1889/1.1825780
Publisher version:http://dx.doi.org/10.1889/1.1825780
UCL classification:UCL > School of BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology

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