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Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs

Karim, KS; Nathan, AH; M, M; W, I; (2004) Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs. IEEE Electron Device Letters , 25 188 - 190.

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Type:Article
Title:Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs
UCL classification:UCL > School of BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology

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