Karim, KS and Nathan, AH and M, M and W, I (2004) Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs. IEEE Electron Device Letters , 25 188 - 190.
Full text not available from this repository.
| Type: | Article |
|---|---|
| Title: | Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs |
| UCL classification: | UCL > School of BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology |
Archive Staff Only: edit this record