Karim, KS and Nathan, AH and M, M and W, I (2004) Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs. IEEE Electron Device Letters , 25 188 - 190.
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|Title:||Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs|
|UCL classification:||UCL > School of BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology|
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