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Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs

Karim, KS; Nathan, AH; M, M; W, I; (2004) Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs. IEEE Electron Device Letters , 25 188 - 190.

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Type: Article
Title: Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs
UCL classification: UCL > School of BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology
URI: http://discovery.ucl.ac.uk/id/eprint/42786
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