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Accelerated stress testing of a-Si:H TFT pixel circuits for AMOLED displays

Sakariya, K; Ng C, H; I, S; A, T; S, N; A, ; (2004) Accelerated stress testing of a-Si:H TFT pixel circuits for AMOLED displays. Materials Research Society Symposium Proceedings , 808 A4.11.1 - A4.11.6.

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Type: Article
Title: Accelerated stress testing of a-Si:H TFT pixel circuits for AMOLED displays
UCL classification: UCL > School of BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology
URI: http://discovery.ucl.ac.uk/id/eprint/42747
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