Li, FM;
O, N;
Nathan, A;
(2004)
Degradation behaviour and damage mechanisms of CCD image sensor with deep-UV laser radiation.
IEEE Transactions on Electron Devices
, 51
pp. 2229-2236.
| Type: | Article |
|---|---|
| Title: | Degradation behaviour and damage mechanisms of CCD image sensor with deep-UV laser radiation |
| UCL classification: | UCL > School of BEAMS UCL > School of BEAMS > Faculty of Maths and Physical Sciences UCL > School of BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology |
| URI: | http://discovery.ucl.ac.uk/id/eprint/42714 |
Downloads since deposit
0Downloads
Download activity - last month
Download activity - last 12 months
Downloads by country - last 12 months
Archive Staff Only
 |
View Item |