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Effect of threshold voltage instability on field effect mobility in thin film transistors deduced from constant current measurements

Ahnood, A; Chaji, GR; Sazonov, A; Nathan, A; (2009) Effect of threshold voltage instability on field effect mobility in thin film transistors deduced from constant current measurements. APPLIED PHYSICS LETTERS , 95 (6) 10.1063/1.3195641.

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Type: Article
Title: Effect of threshold voltage instability on field effect mobility in thin film transistors deduced from constant current measurements
DOI: 10.1063/1.3195641
Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, thin film transistors
UCL classification: UCL > School of BEAMS
UCL > School of BEAMS > Faculty of Engineering Science
URI: http://discovery.ucl.ac.uk/id/eprint/398468
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