Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy.
Applied Physics Letters
Propagation of terahertz waves in hollow metallic waveguides depends on the waveguide mode. Near-field scanning probe terahertz microscopy is applied to identify the mode structure and composition in dielectric-lined hollow metallic waveguides. Spatial profiles, relative amplitudes, and group velocities of three main waveguide modes are experimentally measured and matched to the HE11, HE12, and TE11 modes. The combination of near-field microscopy with terahertz time-resolved spectroscopy opens the possibility of waveguide mode characterization in the terahertz band.
|Title:||Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy|
|Open access status:||An open access version is available from UCL Discovery|
|Additional information:||Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 94 (17). 171104-1-171104-3 and may be found at http://dx.doi.org/10.1063/1.3126053|
|UCL classification:||UCL > School of BEAMS > Faculty of Engineering Science > Electronic and Electrical Engineering|
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