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Josephson current suppression in three-dimensional focused-ion-beam fabricated sub-micron intrinsic junctions

Warburton, PA; Fenton, JC; Korsah, M; Grovenor, CRM; (2006) Josephson current suppression in three-dimensional focused-ion-beam fabricated sub-micron intrinsic junctions. Superconductor Science and Technology , 19 (5) S187 - S190. 10.1088/0953-2048/19/5/S04. Green open access

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Abstract

We have fabricated intrinsic Josephson junction arrays in Tl2Ba2CaCu2O8 thin films using three-dimensional focused-ion-beam milling. We have measured the dependence of the switching current density of these arrays at 4.2 K upon the junction cross-sectional area. There is strong suppression of the switching current density for junctions of area less than 1 mu m(2), the current extrapolating to zero at an area of 0.25 mu m(2). We discuss the possible roles of gallium ion implantation and both thermal and quantum fluctuations in this current suppression.

Type: Article
Title: Josephson current suppression in three-dimensional focused-ion-beam fabricated sub-micron intrinsic junctions
Location: Noordwijkerhout, NETHERLANDS
Open access status: An open access version is available from UCL Discovery
DOI: 10.1088/0953-2048/19/5/S04
Publisher version: http://dx.doi.org/10.1088/0953-2048/19/5/S04
Language: English
Additional information: © 2006 IOP Publishing Ltd
Keywords: ARRAYS
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology
URI: http://discovery.ucl.ac.uk/id/eprint/152959
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