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Simultaneous positive and negative FIB-SIMS of a SiOx-based Resistive RAM device

Chater, RJ; Montesi, L; Buckwell, M; van den Bosch, CAM; Fearn, S; Mehonic, A; Aguadero, A; (2016) Simultaneous positive and negative FIB-SIMS of a SiOx-based Resistive RAM device. Presented at: SIMS Europe 2016, Münster, Germany. (In press).

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Type: Conference item (Presentation)
Title: Simultaneous positive and negative FIB-SIMS of a SiOx-based Resistive RAM device
Event: SIMS Europe 2016
Location: Münster, Germany
Dates: 18 September 2016 - 20 September 2016
Publisher version: https://www.conftool.pro/sims-europe-2016/index.ph...
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: http://discovery.ucl.ac.uk/id/eprint/1517636
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