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Gaussian process regression: Active data selection and test point rejection

Seo, S; Wallat, M; Graepel, T; Obermayer, K; (2000) Gaussian process regression: Active data selection and test point rejection. In: Amari, SI and Giles, CL and Mori, M and Piuri, V, (eds.) (Proceedings) IEEE/INNS/ENNS International Joint Conference on Neural Networks (IJCNN 2000). (pp. pp. 241-246). IEEE COMPUTER SOC

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Type: Proceedings paper
Title: Gaussian process regression: Active data selection and test point rejection
Event: IEEE/INNS/ENNS International Joint Conference on Neural Networks (IJCNN 2000)
Location: COMO, ITALY
Dates: 24 July 2000 - 27 July 2000
DOI: 10.1109/IJCNN.2000.861310
Keywords: Science & Technology, Technology, Computer Science, Artificial Intelligence, Engineering, Electrical & Electronic, Computer Science, Engineering
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Computer Science
URI: http://discovery.ucl.ac.uk/id/eprint/1515286
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