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Luminescence efficiency measurements of silicon nanoclusters

Kenyon, AJ; Trwoga, PF; Pitt, CW; Rehm, G; (1998) Luminescence efficiency measurements of silicon nanoclusters. Applied Physics Letters , 73 (4) 523 - 525. 10.1063/1.121921. Green open access

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Abstract

We present the results of what we believe to be the first study of the power efficiency of room temperature photoluminescence from thin films of silica containing silicon nanoclusters. Films were prepared by plasma enhanced chemical vapor deposition from silane and nitrous oxide precursors. Luminescence was excited using the 476 nm line of an argon-ion laser. We have measured power efficiencies for samples that exhibit luminescence solely due to radiative recombination of quantum confined excitons. Efficiencies around 0.04% are reported. (C) 1998 American Institute of Physics.

Type: Article
Title: Luminescence efficiency measurements of silicon nanoclusters
Open access status: An open access version is available from UCL Discovery
DOI: 10.1063/1.121921
Publisher version: http://dx.doi.org/10.1063/1.121921
Language: English
Additional information: Copyright 1998 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Kenyon, AJ and Trwoga, PF and Pitt, CW and Rehm, G (1998) Luminescence efficiency measurements of silicon nanoclusters. Applied Physics Letters, 73 (4) 523 – 525 and may be found at http://link.aip.org/link/?apl/73/00523
Keywords: THIN-FILMS, LIGHT-EMISSION, RICH SILICA, SI, ELECTROLUMINESCENCE, PHOTOLUMINESCENCE
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: http://discovery.ucl.ac.uk/id/eprint/149922
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