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Scanning acoustic microscopy and its potential in S.E.M.

Golan, G; Kenyon, AJ; Griffel, G; Pitt, CW; (1995) Scanning acoustic microscopy and its potential in S.E.M. In: (Proceedings) Scanning Electron Microscope Conference at the Center for Technological Education. : Holon.

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Type: Proceedings paper
Title: Scanning acoustic microscopy and its potential in S.E.M.
Event: Scanning Electron Microscope Conference at the Center for Technological Education
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: http://discovery.ucl.ac.uk/id/eprint/148855
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