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Current Transport and Electroluminescence Mechanisms in Thin SiO2 Films Containing Si Nanoclusters-Sensitized Er Ion

Jambois, O; Berencen, Y; Hijazi, K; Wojdak, M; Kenyon, AJ; Gourbilleau, F; Rizk, R; (2009) Current Transport and Electroluminescence Mechanisms in Thin SiO2 Films Containing Si Nanoclusters-Sensitized Er Ion. In: (Proceedings) Impurity Based Electroluminescent Devices and Materials Conference. : Barcelona, Spain.

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Type: Proceedings paper
Title: Current Transport and Electroluminescence Mechanisms in Thin SiO2 Films Containing Si Nanoclusters-Sensitized Er Ion
Event: Impurity Based Electroluminescent Devices and Materials Conference
UCL classification: UCL > School of BEAMS > Faculty of Engineering Science > Electronic and Electrical Engineering
URI: http://discovery.ucl.ac.uk/id/eprint/148238
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