Pang, CL; Sasahara, A; Onishi, H; (2015) Noncontact atomic force and Kelvin probe force microscopy on MgO(100) and MgO(100)-supported Ba. Surface Science 10.1016/j.susc.2015.09.022.

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Abstract

Atomically-flat MgO(100) surfaces were prepared by sputtering and annealing. Noncontact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM) were used to characterize the MgO(100) surfaces. The NC-AFM images revealed the presence of point defects on an atomically-resolved surface. The surface potential at these point defects, as well as features such as step edges and deposited Ba nanoparticles were mapped using KPFM. The Kelvin images show that the surface potential increases at the point defects and at the step edges. On the other hand, a decrease in the potential was found over Ba nanoparticles which can be explained by electron charge transfer from the Ba to the MgO.

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