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Mechanical breakdown of bent silicon nanowires imaged by coherent x-ray diffraction

Shi, X; Clark, JN; Xiong, G; Huang, X; Harder, R; Robinson, IK; (2013) Mechanical breakdown of bent silicon nanowires imaged by coherent x-ray diffraction. NEW JOURNAL OF PHYSICS , 15 , Article ARTN 123007. 10.1088/1367-2630/15/12/123007. Green open access

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Abstract

We have developed a method of coherent x-ray diffractive imaging to surmount its inability to image the structure of strongly strained crystals. We used calculated models from finite–element analysis to guide an iterative algorithm to fit experimental data from a series of increasingly bent wires cut into silicon-on-insulator films. Just before mechanical fracture, the wires were found to contain new phase structures, which are identified as dislocations associated with crossing the elastic limit.

Type: Article
Title: Mechanical breakdown of bent silicon nanowires imaged by coherent x-ray diffraction
Open access status: An open access version is available from UCL Discovery
DOI: 10.1088/1367-2630/15/12/123007
Publisher version: http://dx.doi.org/10.1088/1367-2630/15/12/123007
Additional information: © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology
URI: http://discovery.ucl.ac.uk/id/eprint/1421782
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