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Analytical Field-Effect Method for Extraction of Subgap States in Thin-Film Transistors

Lee, S; Ahnood, A; Sambandan, S; Madan, A; Nathan, A; (2012) Analytical Field-Effect Method for Extraction of Subgap States in Thin-Film Transistors. IEEE ELECTRON DEVICE LETTERS , 33 (7) pp. 1006-1008. 10.1109/LED.2012.2193657.

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Type: Article
Title: Analytical Field-Effect Method for Extraction of Subgap States in Thin-Film Transistors
DOI: 10.1109/LED.2012.2193657
Keywords: Science & Technology, Technology, Engineering, Electrical & Electronic, Engineering, Amorphous semiconductor thin-film transistors (TFTs), density of subgap states (subgap DOS), field-effect mobility, AMORPHOUS-SILICON, TRANSIENT, DENSITY
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: http://discovery.ucl.ac.uk/id/eprint/1400559
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