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Localized tail state distribution in amorphous oxide transistors deduced from low temperature measurements

Lee, S; Nathan, A; (2012) Localized tail state distribution in amorphous oxide transistors deduced from low temperature measurements. APPLIED PHYSICS LETTERS , 101 (11) 10.1063/1.4751861.

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Type: Article
Title: Localized tail state distribution in amorphous oxide transistors deduced from low temperature measurements
DOI: 10.1063/1.4751861
Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, FIELD-EFFECT TRANSISTORS, THIN-FILM TRANSISTORS, SILICON, CRYSTALLINE, DENSITY
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: http://discovery.ucl.ac.uk/id/eprint/1400558
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