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Revealing surface oxidation on the organic semi-conducting single crystal rubrene with time of flight secondary ion mass spectroscopy

Thompson, RJ; Fearn, S; Tan, KJ; Cramer, HG; Kloc, CL; Curson, NJ; Mitrofanov, O; (2013) Revealing surface oxidation on the organic semi-conducting single crystal rubrene with time of flight secondary ion mass spectroscopy. PHYSICAL CHEMISTRY CHEMICAL PHYSICS , 15 (14) pp. 5202-5207. 10.1039/c3cp50310k.

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Type: Article
Title: Revealing surface oxidation on the organic semi-conducting single crystal rubrene with time of flight secondary ion mass spectroscopy
DOI: 10.1039/c3cp50310k
Keywords: Science & Technology, Physical Sciences, Chemistry, Physical, Physics, Atomic, Molecular & Chemical, Chemistry, Physics, TOF-SIMS, GA BOMBARDMENT, C-60, SEMICONDUCTORS, SPECTROMETRY, FILMS, MOLECULES, POLYMERS, AG(111), GROWTH
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology
URI: http://discovery.ucl.ac.uk/id/eprint/1399419
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