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Ion-beam-induced bending of freestanding amorphous nanowires: The importance of the substrate material and charging

Cui, A; Fenton, JC; Li, W; Shen, TH; Liu, Z; Luo, Q; Gu, C; (2013) Ion-beam-induced bending of freestanding amorphous nanowires: The importance of the substrate material and charging. Applied Physics Letters , 102 (21) , Article 213112. 10.1063/1.4807663. Green open access

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Abstract

Ion-beam irradiation offers great flexibility and controllability in the construction of freestanding nanostructures with multiple advanced functionalities. Here, we present and discuss the bending of free-standing nanowires, against, towards, and ultimately parallel to a flux of directional ion irradiation. Bending components both along and perpendicular to the incident ion beam were observed, and the bending behavior was found to depend both on the ion beam scanning strategy and on the conductivity of the supporting substrate. This behavior is explained by an ion-irradiation-related electrostatic interaction. Our findings suggest the prospect of exploiting this technique to engineer 3D nanostructures for advanced applications.

Type: Article
Title: Ion-beam-induced bending of freestanding amorphous nanowires: The importance of the substrate material and charging
Open access status: An open access version is available from UCL Discovery
DOI: 10.1063/1.4807663
Publisher version: http://dx.doi.org/10.1063/1.4807663
Language: English
Additional information: © 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 102, 213112 (2013); and may be found at http://dx.doi.org/10.1063/1.4807663
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
URI: https://discovery.ucl.ac.uk/id/eprint/1394913
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